upstream u-boot with additional patches for our devices/boards: https://lists.denx.de/pipermail/u-boot/2017-March/282789.html (AXP crashes) ; Gbit ethernet patch for some LIME2 revisions ; with SPI flash support

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Simon Glass 61ccd886e2 dm: usb: Clean up USB after each test ... The USB subsystem has a few counters that need to be reset since they are stored in static variables rather than driver-model data. An example is usb_max_devs. Ultimately we should move this data into the USB uclass. For now, make sure that USB is reset after each test, so that the counters go back to zero. Note: this is not a perfect solution: It a USB test fails it will exit immediately and leave USB un-reset. The impact here is that it may cause subsequence test failures in the same run. Signed-off-by: Simon Glass <sjg@chromium.org>		8 years ago
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dm	dm: usb: Clean up USB after each test	8 years ago
env	…
fs	…
image	image: Fix FIT and vboot tests to exit sandbox correctly	8 years ago
py	…
stdint	…
trace	trace: Improve the trace test number recognition	8 years ago
vboot	image: Fix FIT and vboot tests to exit sandbox correctly	8 years ago
Kconfig	…
Makefile	…
cmd_ut.c	…
command_ut.c	…
common.sh	…
compression.c	…
time_ut.c	…
ut.c	…