At present only root nodes in the device tree are scanned for devices. But some devices can have children. For example a SPI bus may have several children for each of its chip selects. Add a function which scans subnodes and binds devices for each one. This can be used for the root node scan also, so change it. A device can call this function in its bind() or probe() methods to bind its children. Signed-off-by: Simon Glass <sjg@chromium.org>master
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/*
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* Copyright (c) 2014 Google, Inc |
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* |
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* SPDX-License-Identifier: GPL-2.0+ |
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*/ |
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#include <common.h> |
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#include <dm.h> |
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#include <dm/root.h> |
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#include <dm/test.h> |
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#include <dm/ut.h> |
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#include <dm/util.h> |
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DECLARE_GLOBAL_DATA_PTR; |
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static int testbus_drv_probe(struct udevice *dev) |
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{ |
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return dm_scan_fdt_node(dev, gd->fdt_blob, dev->of_offset, false); |
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} |
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static const struct udevice_id testbus_ids[] = { |
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{ |
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.compatible = "denx,u-boot-test-bus", |
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.data = DM_TEST_TYPE_FIRST }, |
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{ } |
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}; |
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U_BOOT_DRIVER(testbus_drv) = { |
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.name = "testbus_drv", |
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.of_match = testbus_ids, |
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.id = UCLASS_TEST_BUS, |
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.probe = testbus_drv_probe, |
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.priv_auto_alloc_size = sizeof(struct dm_test_priv), |
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.platdata_auto_alloc_size = sizeof(struct dm_test_pdata), |
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}; |
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UCLASS_DRIVER(testbus) = { |
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.name = "testbus", |
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.id = UCLASS_TEST_BUS, |
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}; |
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/* Test that we can probe for children */ |
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static int dm_test_bus_children(struct dm_test_state *dms) |
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{ |
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int num_devices = 4; |
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struct udevice *bus; |
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struct uclass *uc; |
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ut_assertok(uclass_get(UCLASS_TEST_FDT, &uc)); |
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ut_asserteq(num_devices, list_count_items(&uc->dev_head)); |
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/* Probe the bus, which should yield 3 more devices */ |
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ut_assertok(uclass_get_device(UCLASS_TEST_BUS, 0, &bus)); |
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num_devices += 3; |
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ut_assertok(uclass_get(UCLASS_TEST_FDT, &uc)); |
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ut_asserteq(num_devices, list_count_items(&uc->dev_head)); |
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ut_assert(!dm_check_devices(dms, num_devices)); |
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return 0; |
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} |
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DM_TEST(dm_test_bus_children, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); |
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