This test introduces new test structure type:dm_test_perdev_uc_pdata. The structure consists of three int values only. For the test purposes, three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1. This commit adds two test cases for uclass platform data: - Test: dm_test_autobind_uclass_pdata_alloc - this tests if: * uclass driver sets: .per_device_platdata_auto_alloc_size field * the devices's: dev->uclass_platdata is non-NULL - Test: dm_test_autobind_uclass_pdata_valid - this tests: * if the devices's: dev->uclass_platdata is non-NULL * the structure of type 'dm_test_perdev_uc_pdata' allocated at address pointed by dev->uclass_platdata. Each structure field, should be equal to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1. Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com> Cc: Simon Glass <sjg@chromium.org> Acked-by: Simon Glass <sjg@chromium.org>master
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