sunxi: dram: Improve DQS gate data training error handling

The stale error status should be cleared for all sun4i/sun5i/sun7i
hardware and not just for sun7i. Also there are two types of DQS
gate training errors ("found no result" and "found more than one
possible result"). Both are handled now.

Signed-off-by: Siarhei Siamashka <siarhei.siamashka@gmail.com>
Acked-by: Ian Campbell <ijc@hellion.org.uk>
Signed-off-by: Hans de Goede <hdegoede@redhat.com>

arch/arm/cpu/armv7/sunxi/dram.c

@@ -357,9 +357,7 @@ static int dramc_scan_readpipe(void)
 	u32 reg_val;
 
 	/* data training trigger */
-#ifdef CONFIG_SUN7I
 	clrbits_le32(&dram->csr, DRAM_CSR_FAILED);
-#endif
 	setbits_le32(&dram->ccr, DRAM_CCR_DATA_TRAINING);
 
 	/* check whether data training process has completed */

arch/arm/include/asm/arch-sunxi/dram.h

@@ -133,7 +133,9 @@ struct dram_para {
 #define DRAM_DCR_MODE_SEQ 0x0
 #define DRAM_DCR_MODE_INTERLEAVE 0x1
 
-#define DRAM_CSR_FAILED (0x1 << 20)
+#define DRAM_CSR_DTERR  (0x1 << 20)
+#define DRAM_CSR_DTIERR (0x1 << 21)
+#define DRAM_CSR_FAILED (DRAM_CSR_DTERR | DRAM_CSR_DTIERR)
 
 #define DRAM_DRR_TRFC(n) ((n) & 0xff)
 #define DRAM_DRR_TREFI(n) (((n) & 0xffff) << 8)