The regulator_autoset() function mixes printf() output and PMIC adjustment
code. It provides a boolean to control the output. It is better to avoid
missing logic and output, and this permits a smaller SPL code size. So
split the output into a separate function.
Also rename the function to have a by_name() suffix, since we would like
to be able to pass a device when we know it, and thus avoid the name
search.
Signed-off-by: Simon Glass <sjg@chromium.org>
Tested-by: Przemyslaw Marczak <p.marczak@samsung.com>
Acked-by: Przemyslaw Marczak <p.marczak@samsung.com>
Separate the ability to define tests and assert status of test functions
from the dm tests so they can be used more consistently throughout all
tests.
Signed-off-by: Joe Hershberger <joe.hershberger@ni.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
This change adds new file to sandbox driver model test environment.
The file is: test/dm/power.c, and it includes tests for PMIC framework,
which includes PMIC uclass and REGULATOR uclass.
All tests are based od Sandbox PMIC emulated device. Some test constants for
this device are defined in the header: include/power/sandbox_pmic.h
PMIC tests includes:
- pmic get - tests, that pmic_get() returns the requested device
- pmic I/O - tests I/O by writing and reading some values to PMIC's registers
and then compares, that the write/read values are equal.
The regulator tests includes:
- Regulator get by devname/platname
- Voltage set/get
- Current set/get
- Enable set/get
- Mode set/get
- Autoset
- List autoset
For the regulator 'get' test, the returned device pointers are compared,
and their names are also compared to the requested one.
Every other test, first sets the given attribute and next try to get it.
The test pass, when the set/get values are equal.
Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Acked-by: Simon Glass <sjg@chromium.org>
Tested on sandbox:
Tested-by: Simon Glass <sjg@chromium.org>
Simon Glass
Joe Hershberger
Przemyslaw Marczak